Ion milling of InP specimens with Ar/O2 for transmission electron microscopy
- 1 January 1987
- journal article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 5 (1) , 107-108
- https://doi.org/10.1002/jemt.1060050112
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Ion beam milling of InP with an Ar/O2-gas mixtureApplied Physics Letters, 1984
- Iodine ion milling of indium-containing compound semiconductorsApplied Physics Letters, 1984