noise in GaAs: Evidence of a new scale invariance
- 15 September 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 34 (6) , 4419-4422
- https://doi.org/10.1103/physrevb.34.4419
Abstract
Low-frequency noise measurements were made in the temperature range of 77-340 K on submicrometer resistors made from GaAs grown by molecular-beam epitaxy. Two types of noise were found, depending on surface treatment. One type consisted of discrete spectral components which showed no anomalous statistical behavior. The other type was a small component which showed anomalously large variations in spectral density, with these variations themselves having a spectrum.
Keywords
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