Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer
- 1 December 1991
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 310 (3) , 677-680
- https://doi.org/10.1016/0168-9002(91)91116-d
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Ion-implanted capacitively coupled silicon strip detectors with integrated polysilicon bias resistors processed on a 100 mm waferNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1991
- Beam test results from a prototype for the delphi microvertex detectorNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- Development of high density readout for silicon strip detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1984