Electrical measurements as early indicators of electromigration failure
- 1 January 1995
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 35 (1) , 13-25
- https://doi.org/10.1016/0026-2714(94)p1834-y
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Characterisation of electromigration damage by multiple electrical measurementsMicroelectronics Reliability, 1993
- Electrical Noise as a Measure of Quality and Reliability in Electronic DevicesPublished by Elsevier ,1993