Characterization of MOSFETs on very thin SOI at temperatures from 77 K to 350 K

Publisher Website

13 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 56-57
https://doi.org/10.1109/soi.1989.69763

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Short-channel effects in MOSFET's at liquid-Nitrogen temperature
IEEE Transactions on Electron Devices, 1986
Very small MOSFET's for low-temperature operation
IEEE Transactions on Electron Devices, 1977