Thick Target Yields of Characteristic X-Rays by p, d, 3He+ and 4He+ Bombardments
- 1 November 1970
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 9 (11)
- https://doi.org/10.1143/jjap.9.1297
Abstract
Characteristic X-ray yields by p, d, 3He+ and 4He+ bombardments have been measured for various thick metallic elements in the incident energy range from 90 to 360 keV. The combination of incident particles, target materials and produced characteristic X-rays is given as: (a) Al–K, Ti–K, Ni–K, Cu–K, Ni–L, Cu–L, Zr–L, Mo-L, Ag–L, Cd–L, Sn–L, Ta–M, W–M, Pt–M and Pb–M for proton bombardment, (b) Al–K, Ti–K, Cu–K, Ni-L, Cu–L, Zr–L, Mo–L, Ag–L, Cd–L, Sn–L, Ta–M, W–M, Pt–M and Pb–M for deuteron bombardment, (c) Al–K, Ni–L, Cu–L, Mo–L, Ag–L and W–M for 3He+ bombardment, (d) Al–K, Ni–L, Cu–L, Mo–L, Ag–L, W–M, Pt–M and Pb–M for 4He+ bombardment. The thick target yields against particle energy have been found to increase more steeply as target atomic number becomes larger. The behaviors of yield ratios of I µ(d)/I µ(P) and I µ(4He+)/I µ(3He+) have been qualitatively explained by the effect of average charge of the incident particles.Keywords
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