Experimental Evidence of Hot-Electron Transport through Thin Metal Films

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Abstract
The metal‐base triode sandwich was used to measure the current transfer ratio in a Schottky barrier structure. The transfer ratio is discussed considering two distinct current types—that through base metal and that through pinholes. An electron‐phonon mean free path of 125 Å and an electron‐electron mean free path of 230 Å (at 0.7 eV) were measured. An investigation of the structure of very thin Al and Au films deposited on Al2O3 was made by transmission electron microscopy. Al films were found to be more continuous than Au films of comparable thickness.