The g-Values of Defects in Amorphous C, Si and Ge
- 1 December 1981
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 20 (12) , L920
- https://doi.org/10.1143/jjap.20.l920
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- The g-Values of Defects in Amorphous C, Si and GeJapanese Journal of Applied Physics, 1981