S-Parameters Measurement of Chip GaAs FETs up TO 22 GHz using the TRL Calibration Technique
- 1 October 1989
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 576-581
- https://doi.org/10.1109/euma.1989.334030
Abstract
In this paper, the design of a Microstrip Test Fixture for TRL calibration is described. Experimental results for S-parameters measurement of a GaAs FET chip in the 3-22 GHz frequency range are presented. Repeatability of connections and measurements is discussed and experimental results are also presented.Peer ReviewedPostprint (published versionKeywords
This publication has 1 reference indexed in Scilit:
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979