Determination of very low diffusion coefficients in glass with means of secondary-ion mass spectrometry

This publication has 5 references indexed in Scilit:

• Sputtering of flat glass surfaces with noble gas ions
  Physica Status Solidi (a), 1978
• Ermittlung kleiner Diffusionskoeffizienten mittels SIMS in oxydischen Verbindungen
  Mikrochimica Acta, 1977
• Interdiffusion of hydrogen and alkali ions in a glass surface
  Journal of Non-Crystalline Solids, 1975
• Secondary−ion mass spectrometry and its use in depth profiling
  Journal of Vacuum Science and Technology, 1975
• The Function Inverfc ?
  Australian Journal of Physics, 1960