Extraction of device noise sources from measured data using circuit simulator software
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 41 (2) , 340-343
- https://doi.org/10.1109/22.216478
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Extraction of FET model noise-parameters from measurementPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Modeling of noise parameters of MESFETs and MODFETs and their frequency and temperature dependenceIEEE Transactions on Microwave Theory and Techniques, 1989
- A new method for determining the FET small-signal equivalent circuitIEEE Transactions on Microwave Theory and Techniques, 1988
- Representation of Noise in Linear TwoportsProceedings of the IRE, 1960
- Theory of Noisy FourpolesProceedings of the IRE, 1956