Delocalization corrections for electron channeling analysis
- 31 December 1988
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 26 (1-2) , 239-248
- https://doi.org/10.1016/0304-3991(88)90397-x
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Axial electron-channelling analysis of perovskite: II. Site identification of Sr, Zr and U impuritiesPhilosophical Magazine Part B, 1988
- Axial electron-channelling analysis of perovskite: I. Theory and experiment for CaTiO3Philosophical Magazine Part B, 1988
- The determination of site occupancies in garnet by planar and axial ALCHEMIUltramicroscopy, 1987
- Localization and ALCHEMI for zone axis orientationsUltramicroscopy, 1987
- Atom Location by Axial-Electron-Channeling AnalysisPhysical Review Letters, 1985
- Spatially resolved measurement of substitutional dopant concentrations in semiconductorsApplied Physics Letters, 1984
- ALCHEMI: a new technique for locating atoms in small crystalsJournal of Microscopy, 1983
- The cation-atom distribution in a (Cr, Fe, Al, Mg)3O4spinel as revealed from the channelling effect in electron-induced X-ray emissionJournal of Applied Crystallography, 1982
- Study of single-electron excitations by electron microscopy I. Image contrast from delocalized excitationsPhilosophical Magazine A, 1978
- Inelastic Collisions of Fast Charged Particles with Atoms and Molecules—The Bethe Theory RevisitedReviews of Modern Physics, 1971