Surface step and defect structure of Cr(001) studied by scanning tunneling microscopy
- 1 September 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 235 (1) , 1-4
- https://doi.org/10.1016/0039-6028(90)90100-m
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Local structure of the Si(100) surface studied by scanning tunneling microscopySurface Science, 1990
- Scanning Tunnelling Microscopy Study of Si(111) 7×7 in the Presence of Multiple-Step EdgesEurophysics Letters, 1990
- Surface structure of NiAl(111) determined by ion scattering and scanning tunneling microscopySurface Science, 1990
- Ferromagnetism versus antiferromagnetism of the Cr(001) surfacePhysical Review B, 1989
- Experimental and theoretical investigations of Cr(001) surface electronic structurePhysical Review B, 1985