Two-dimensional density of states for electrons bound to impurities inside inversion layers at the semiconductor-insulator interface
- 1 November 1983
- journal article
- Published by Elsevier in Surface Science
- Vol. 134 (1) , 135-144
- https://doi.org/10.1016/0039-6028(83)90316-3
Abstract
No abstract availableKeywords
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