Self-consistent calculation of impurity scattering in inversion layers
- 31 December 1978
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 28 (10) , 861-863
- https://doi.org/10.1016/0038-1098(78)90174-6
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Electron scattering in silicon inversion layers by oxide and surface roughnessSurface Science, 1976
- Exchange and correlation in atoms, molecules, and solids by the spin-density-functional formalismPhysical Review B, 1976
- Density-functional calculation of sub-band structure in accumulation and inversion layersPhysical Review B, 1976
- Properties of Semiconductor Surface Inversion Layers in the Electric Quantum LimitPhysical Review B, 1967
- One-Particle Properties of an Inhomogeneous Interacting Electron GasPhysical Review B, 1966
- Self-Consistent Equations Including Exchange and Correlation EffectsPhysical Review B, 1965