An X-Ray Topography Study of Dislocation Formation and Motion in Aluminium
- 16 July 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 6 (1) , 153-159
- https://doi.org/10.1002/pssa.2210060117
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- X-Ray Topographic Study of Tensile Deformation in Nearly Perfect Copper CrystalsJournal of Applied Physics, 1971
- Direct Dislocation Velocity Measurement in Silicon by X-Ray TopographyJournal of Applied Physics, 1970
- Dislocations in aluminium under stress observed by lang x-ray topographyActa Metallurgica, 1969
- Aluminium single crystals with very low dislocation densitiesPhilosophical Magazine, 1965
- Zone Refining of AluminumReview of Scientific Instruments, 1963
- Dislocation Multiplication in Lithium Fluoride CrystalsJournal of Applied Physics, 1960
- The projection topograph: a new method in X-ray diffraction microradiographyActa Crystallographica, 1959
- A method for the examination of crystal sections using penetrating characteristic X radiationActa Metallurgica, 1957