Imaging elastic strains in high-angle annular dark field scanning transmission electron microscopy
- 1 December 1993
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 52 (3-4) , 353-359
- https://doi.org/10.1016/0304-3991(93)90046-z
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- High-resolution Z-contrast imaging of crystalsPublished by Elsevier ,2002
- Incoherent imaging of thin specimens using coherently scattered electronsProceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences, 1993
- On the image contrast from dislocations in high-angle annular dark-field scanning transmission electron microscopyPhilosophical Magazine Letters, 1993
- Incoherent imaging of zone axis crystals with ADF STEMUltramicroscopy, 1992
- High-resolution incoherent imaging of crystalsPhysical Review Letters, 1990
- Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scatteringUltramicroscopy, 1989
- Catalyst particle sizes from Rutherford scattered intensitiesJournal of Microscopy, 1989
- Channeling effects from impurity atoms in the high-angle annular detector of the stemUltramicroscopy, 1988
- Elemental mapping with elastically scattered electronsJournal of Microscopy, 1986
- Characteristic X-ray Production in Thin CrystalsZeitschrift für Naturforschung A, 1973