The impact of ASIC devices on the SEU vulnerability of space-borne computers
- 1 December 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 39 (6) , 1685-1692
- https://doi.org/10.1109/23.211354
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- SEU and latchup tolerant advanced CMOS technologyIEEE Transactions on Nuclear Science, 1990
- Advantage of Advanced CMOS over Advanced TTL in a Cosmic Ray EnvironmentIEEE Transactions on Nuclear Science, 1987
- Heavy Ion Induced Upsets in Semiconductor DevicesIEEE Transactions on Nuclear Science, 1985
- CMOS RAM Cosmic-Ray-Induced-Error-Rate AnalysisIEEE Transactions on Nuclear Science, 1981