A Scanning X-Ray Microscope Using Synchrotron Radiation
- 10 November 1972
- journal article
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 178 (4061) , 608-611
- https://doi.org/10.1126/science.178.4061.608
Abstract
Focused synchrotron radiation collimated by means of a pinhole has been used to construct a scanning x-ray microscope capable of making stereoscopic element-discriminating pictures of relatively thick specimens in an atmospheric environment.Keywords
This publication has 2 references indexed in Scilit:
- Metal Membranes with Uniform Submicron-Size PoresJournal of Applied Physics, 1970
- Solid-State Track Detectors: Applications to Nuclear Science and GeophysicsAnnual Review of Nuclear Science, 1965