Reflection-mode scattering-type scanning near-field optical microscope using a laser trapped gold colloidal particle as a scattering probe
- 1 June 2001
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 89 (11) , 6481-6483
- https://doi.org/10.1063/1.1331070
Abstract
We have developed a reflection-mode scattering-typescanning near-field optical microscope using a laser trapped goldcolloidal particle as a scattering probe and succeeded in observing the reflectance change of an opaque semiconductor sample with the alternating layers of GaAs and Al 0.55 Ga 0.45 As . The spatial resolution became as high as 200 nm when using a 200 nm goldcolloidal particle. The results indicated that the resolution obtained in the experiment is in good agreement with the trapped particle size and overcame the diffraction limit (420 nm) of the lens system.This publication has 5 references indexed in Scilit:
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