Atomic number intensity profiles in the scanning electron microscope—gold and aluminium
- 1 May 1976
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 107 (1) , 85-91
- https://doi.org/10.1111/j.1365-2818.1976.tb02426.x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- The dependence of emitted secondary electrons upon the direction of travel of the exciting electronJournal of Physics D: Applied Physics, 1975
- The construction and uses of an efficient backscattered electron detector for scanning electron microscopyJournal of Physics E: Scientific Instruments, 1974
- Monte Carlo Calculations on Electron Scattering in a Solid TargetJapanese Journal of Applied Physics, 1971
- Wide-band detector for micro-microampere low-energy electron currentsJournal of Scientific Instruments, 1960