Reflectance study of the oscillator strength of excitons in semiconductor quantum wells
- 15 September 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 50 (11) , 7499-7508
- https://doi.org/10.1103/physrevb.50.7499
Abstract
The oscillator strength of excitons is investigated systematically in lattice-matched GaAs/ As, strained-well As/GaAs, and strained-well GaAs/ quantum wells (QW’s) using Fourier-transform reflectance spectroscopy. The oscillator strength in GaAs/ As QW’s increases as the well width is reduced, in agreement with the existing theory, while those in As/GaAs and GaAs/ QW’s show a maximum at a certain well width. The well-width dependence of the band nonparabolicity and the overlap of the electron and hole wave functions is responsible for this behavior. The oscillator strengths in As/GaAs and GaAs/ QW’s are differently dependent on the alloy composition; this is also explained in terms of the band nonparabolicity and the wave-function overlap. The temperature dependence of the oscillator strength in these structures is well described by a modified Debye-Waller expression with an averaged phonon mode. The exciton-phonon interaction, deduced from the temperature dependence of the oscillator strength of the zero-phonon line, is mainly determined by confined phonons in GaAs/ As QW’s, and by quasi-three-dimensional phonons in As/GaAs QW’s.
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