Direct Observation of Multiplication of Dislocations in Iron Single Crystal by High Voltage Electron Microscopy (HVEM)
- 1 September 1970
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 29 (3) , 803-804
- https://doi.org/10.1143/jpsj.29.803
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Behavior of Dislocations in Fe-3% Si under StressJournal of the Physics Society Japan, 1969
- A Direct Method to Investigate the Dynamical Properties of Dislocations Based on High Voltage Electron MicroscopyJapanese Journal of Applied Physics, 1969
- On the Preparation of Tensile Test Pieces for Transmission Electron Microscopic ObservationJapanese Journal of Applied Physics, 1969
- Stress Measurable Tensile Device for Electron Microscopic ObservationJournal of the Physics Society Japan, 1968