Stress-Induced Ordering of Point Defects in Copper Near 10°K
- 23 December 1968
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 21 (26) , 1749-1751
- https://doi.org/10.1103/physrevlett.21.1749
Abstract
An anelastic process near 10°K has been found in proton-irradiated copper. It is tentatively identified as the result of stress-induced ordering of the interstitial member of a close pair. The reorientation occurs without annealing being observed. The thermal activation energy for reorientation is 0.015 eV; the strain symmetry axis is in the direction.
Keywords
This publication has 5 references indexed in Scilit:
- Circuit to Measure Decay Rate of a Low Frequency SignalReview of Scientific Instruments, 1964
- Influence of Foreign Solute Atoms on Stage I Recovery in Electron-Irradiated CopperPhysical Review B, 1962
- Thermally Activated Point Defect Migration in CopperPhysical Review B, 1960
- Recovery of Electron-Irradiated Copper. I. Close Pair RecoveryPhysical Review B, 1959
- Isothermal Annealing below 60°K of Deuteron Irradiated Noble MetalsPhysical Review B, 1958