Effect of the molecular environment on the C, N, and O Auger-electron yields induced by MeVH+andHe+ions

The KLL Auger-electron yields from a number of C-, N-, and O-bearing compounds have been measured for either $H^{+}$ or ${\mathrm{He}}^{+}$ bombardment in the incident energy range of 0.6–2.0 MeV. The yields are seen to vary significantly with the chemical environment with variations of greater than 30% observed between ${\mathrm{CH}}_4$ and ${\mathrm{CF}}_4$ yields. These variations seem to be reproducible by two simple scaling laws, one based on the inelastic scattering cross sections of the various molecular components, while the second uses the effective number of valence-shell electrons about the site of the K-shell vacancy. The cross sections are reported for the ${\mathrm{He}}^{+}$-induced carbon and nitrogen Auger-electron yields from ${\mathrm{CH}}_4$, ${\mathrm{C}}_2$ ${\mathrm{H}}_6$, ${\mathrm{C}}_2$ ${\mathrm{H}}_4$, ${\mathrm{C}}_2$ ${\mathrm{H}}_2$, CO, ${\mathrm{CO}}_2$, ${\mathrm{C}}_2$ ${\mathrm{F}}_6$, ${\mathrm{CF}}_4$, (${\mathrm{CH}}_3$ ${)}_2$NH, ${\mathrm{NH}}_3$, ${\mathrm{N}}_2$, and ${\mathrm{N}}_2$O, as well as for the ${\mathrm{H}}^{+}$-induced carbon and oxygen Auger-electron yields from ${\mathrm{C}}_2$ ${\mathrm{H}}_6$, CO, ${\mathrm{CO}}_2$, ${\mathrm{N}}_2$O, and ${\mathrm{O}}_2$.