Procedures for Attenuated Total Reflection Study of Extremely Small Samples
- 1 April 1967
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 6 (4) , 715-718
- https://doi.org/10.1364/ao.6.000715
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 9 references indexed in Scilit:
- Effective Thickness of Bulk Materials and of Thin Films for Internal Reflection SpectroscopyApplied Optics, 1966
- The Rosette—a Unipoint Multiple Internal Reflection ElementApplied Optics, 1966
- Infrared spectra of powders by means of internal reflection spectroscopySpectrochimica Acta, 1965
- On a quarter wave light condenserBritish Journal of Applied Physics, 1965
- Electric Field Strengths at Totally Reflecting InterfacesJournal of the Optical Society of America, 1965
- Multiple Reflection Cells for Internal Reflection Spectrometry.Analytical Chemistry, 1964
- Optical Constants of Aluminum from 300 to 800 ÅJournal of Applied Physics, 1963
- Attenuated total reflectionSpectrochimica Acta, 1961
- SURFACE CHEMISTRY FROM SPECTRAL ANALYSIS OF TOTALLY INTERNALLY REFLECTED RADIATION*The Journal of Physical Chemistry, 1960