A comparison of deep level defects in OMVPE GaAs layers grown on various GaAs substrate types
- 1 June 1988
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 89 (2-3) , 308-312
- https://doi.org/10.1016/0022-0248(88)90415-0
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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