On the Delineation of p-n Junctions in Silicon
- 1 October 1958
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 29 (10) , 1514
- https://doi.org/10.1063/1.1722982
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Two Chemical Stains for Marking p-n Junctions in SiliconJournal of Applied Physics, 1958
- The Use of an Interference Microscope for Measurement of Extremely Thin Surface LayersBell System Technical Journal, 1956