Optical force microscopy with silicone rubber waveguides
Open Access
- 6 January 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 70 (1) , 22-24
- https://doi.org/10.1063/1.119292
Abstract
A simple technique is described for optically imaging the lateral distribution of normal forces exerted onto a flat surface. It is based on the detuning of a silicone rubber planar waveguide by the forces to be investigated. The method is demonstrated by imaging the contact line force of a sessile water droplet on the surface, with a force resolution better than μN. It is shown that the lateral resolution may be much better than the decay length of the waveguide modes used.Keywords
This publication has 6 references indexed in Scilit:
- Binding Strength Between Cell Adhesion Proteoglycans Measured by Atomic Force MicroscopyScience, 1995
- Attenuated total reflectance as a quantum interference phenomenonOptics Letters, 1994
- Long-Range Attraction and Molecular Rearrangements in Receptor-Ligand InteractionsScience, 1992
- Optical excitation of surface plasmons: An introductionContemporary Physics, 1991
- Surface-plasmon microscopyNature, 1989
- Interferometric determination of the complex wave vector of plasmon surface polaritonsJournal of the Optical Society of America B, 1988