A 30 Year Retrospective on Dennard's MOSFET Scaling Paper
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- 1 January 2007
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Solid-State Circuits Society Newsletter
- Vol. 12 (1) , 11-13
- https://doi.org/10.1109/n-ssc.2007.4785534
Abstract
The MOSFET scaling principles for obtaining simultaneous improvements in transistor density, switching speed, and power dissipation described by Robert H. Dennard and others in "Design of Ion-implanted MOSFETs with Very Small Physical Dimensions" (1974 ) became a roadmap for the semiconductor industry to provide systematic and predictable transistor improvements. New technology generations emerging approximately every three years during the 1970's and 1980's and appearing every other year starting in the mid-1990's, promise to continue although we face growing challenges.Keywords
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- Design of ion-implanted MOSFET's with very small physical dimensionsIEEE Journal of Solid-State Circuits, 1974