Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition
- 1 June 2004
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 231-232, 256-260
- https://doi.org/10.1016/j.apsusc.2004.03.031
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Organic Secondary Ion Mass Spectrometry: Sensitivity Enhancement by Gold DepositionAnalytical Chemistry, 2002
- Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces and additivesSurface and Interface Analysis, 1993