Fundamental investigations of secondary ion production during ion bombardment
- 30 April 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 55 (1) , 179-188
- https://doi.org/10.1016/0039-6028(76)90382-4
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Bombardment-induced photon emission from Al and Al2O3 targetsSurface Science, 1974
- Theoretical and experimental aspects of secondary ion mass spectrometryVacuum, 1974
- The theoretical and experimental study of the ionization processes during the low energy ion sputteringSurface Science, 1974
- Removal of Gas Phase Ions by Energy Selection of Secondary IonsJapanese Journal of Applied Physics, 1974
- Ion probe mass spectrometry: OverviewThin Solid Films, 1973