Characterization of flux-grown KTiOPO4 (KTP) crystals by X-ray topography
- 1 March 1991
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 110 (3) , 587-594
- https://doi.org/10.1016/0022-0248(91)90296-h
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Hydrodynamic control of solution inclusion during crystal growth of KTiOPO4 (KTP) from high-temperature solutionJournal of Crystal Growth, 1989
- Potassium titanyl phosphate: properties and new applicationsJournal of the Optical Society of America B, 1989
- Observation of complex domain walls in KTiOPO4Applied Physics Letters, 1988
- Observation and poling of ferroelectric domains in KTiOPO4Applied Physics Letters, 1987
- Fabrication and characterization of optical waveguides in KTiOPO4Applied Physics Letters, 1987
- Electro-optic and dielectric properties of KTiOPO4Applied Physics Letters, 1986
- Phase relations, solubility and growth of potassium titanyl phosphate, KTPJournal of Crystal Growth, 1986
- Flux growth and properties of KTiOPO4Journal of Crystal Growth, 1984
- KxRb1−xTiOPO4: A new nonlinear optical materialJournal of Applied Physics, 1976
- Structure cristalline du monophosphate KTiPO5Zeitschrift für Kristallographie, 1974