Enhanced microwave characterisation technique for cryogenic temperatures
- 6 December 1990
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 26 (25) , 2127-2129
- https://doi.org/10.1049/el:19901370
Abstract
A real-time technique to de-embed broadband S-parameter measurements of MIC/MMIC devices at temperatures down to 13 K is presented. Exceptional accuracy is obtained by using a split-block test fixture and the TRL calibration technique at cryogenic temperatures for the first time. The repeatability of the technique and the measurement of a transmission line at 297 K and 77 K are demonstrated from 0.1 GHz to 20 GHz.Keywords
This publication has 2 references indexed in Scilit:
- Vector measurements of microwave devices at cryogenic temperaturesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Microwave properties and modeling of high-T/sub c/ superconducting thin film meander linePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002