Vector measurements of microwave devices at cryogenic temperatures
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1195-1198
- https://doi.org/10.1109/mwsym.1989.38938
Abstract
A real-time method to de-embed S-parameter measurements of MIC (microwave integrated circuit) devices operated at 77 K is presented. An apparatus to immerse the devices into liquid nitrogen and microstrip jigs that survive the extreme temperature drop were constructed in order to apply the through-reflect-line calibration technique to measurements over a frequency band from 2.5 GHz to 20 GHz. Measurements of both an interdigitated capacitor and a GaAs MESFET cooled in the liquid nitrogen bath are shown for these frequencies.<>Keywords
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