The detection of current filaments in VO2 thin-film switches using the scanning electron microscope
- 31 March 1973
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 16 (3) , 428-429
- https://doi.org/10.1016/0038-1101(73)90019-1
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- The Detection of Current Filaments in Thin Amorphous FilmsJournal of Vacuum Science and Technology, 1972
- Filamentary Conduction in VO2 Coplanar Thin-Film DevicesApplied Physics Letters, 1971
- Semiconducting glasses part II: Properties and interpretationContemporary Physics, 1970
- Thermal filaments in vanadium dioxideIEEE Transactions on Electron Devices, 1969
- Mechanisms for Metal-Nonmental Transitions in Transition-Metal Oxides and SulfidesReviews of Modern Physics, 1968
- Phase Transition in VO2Journal of the Physics Society Japan, 1964