Amorphous hydrogenated silicon-carbon-tin alloy films
- 15 January 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 37 (3) , 1231-1236
- https://doi.org/10.1103/physrevb.37.1231
Abstract
A new amorphous semiconductor alloy system a-Si-C-Sn:H has been prepared by rf magnetron sputtering of Sn in an atmosphere of , , and Ar. Optical properties and dark conductivity of thin films are measured as a function of flux. The dark conductivity displays a transition to a hopping-conduction mechanism as the flux increases. In ir spectra, C-Sn and Sn-Sn vibrational bands are observed at 510 and 150 , respectively. Dangling-bond density values are deduced from ESR measurements.
Keywords
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