Amorphous hydrogenated silicon-carbon-tin alloy films

Abstract
A new amorphous semiconductor alloy system a-Si-C-Sn:H has been prepared by rf magnetron sputtering of Sn in an atmosphere of SiH4, CH4, and Ar. Optical properties and dark conductivity of thin films are measured as a function of CH4 flux. The dark conductivity displays a transition to a hopping-conduction mechanism as the CH4 flux increases. In ir spectra, C-Sn and Sn-Sn vibrational bands are observed at 510 and 150 cm1, respectively. Dangling-bond density values are deduced from ESR measurements.