Morphology and structure of TiO2 thin layers vs. thickness and substrate temperature
- 1 March 1989
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 170 (1) , 107-126
- https://doi.org/10.1016/0040-6090(89)90627-5
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- In situ and air index measurements: influence of the deposition parameters on the shift of TiO_2/SiO_2 Fabry-Perot filtersApplied Optics, 1986
- HREM study of crystalline and amorphous regions of a TiO2 thin layer: Modification of the lattice parameter inside small clustersPhysica Status Solidi (a), 1986
- Computer Simulation Of Thin Film Growth: Applying The Results To Optical CoatingsOptical Engineering, 1986
- Influence of some parameters on the surface profile restored from microdensitometer analysis of electron micrographs of surface replicasApplied Optics, 1984
- Revised structure zone model for thin film physical structureJournal of Vacuum Science & Technology A, 1984
- Study of surface roughness using a microdensitometer analysis of electron micrographs of surface replicas: I Surface profilesJournal of the Optical Society of America, 1981
- Refractive indices of TiO_2 films produced by reactive evaporation of various titanium–oxygen phasesApplied Optics, 1976