Properties of Thin Metal Films at Microwave Frequencies
- 15 February 1968
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 39 (3) , 1747-1752
- https://doi.org/10.1063/1.1656424
Abstract
The power transmission, reflection, and absorption coefficients of thin metal films positioned in the transverse plane of a rectangular waveguide are investigated. The results are presented as a function of film thickness for iron, nickel, and silver at 9800 MHz using (a) theoretical expressions for conductivity as a function of film thickness, and (b) measured values of conductivity. Experimental transmission data were obtained and compare favorably with theory.This publication has 7 references indexed in Scilit:
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