Background corrections for quantitative electron microprobe analysis using a lithium drifted silicon X-ray detector
- 1 March 1973
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 6 (3) , 286-288
- https://doi.org/10.1088/0022-3735/6/3/025
Abstract
The rather broad peaks obtained with a Si(Li) detector often necessitate extrapolation of background over a considerable energy range. In many samples no background readings free of interference from peaks can be obtained below 2.7 keV. A procedure for calculating background over the whole spectrum for measurements at 2.96 keV (Ar K alpha ) and 9.87 keV (Ge K alpha ) is described. For samples consisting of elements below 30 in atomic number the background correction can be determined with an error not exceeding an equivalent concentration of 0.1 wt %.Keywords
This publication has 3 references indexed in Scilit:
- Pulse pile-up rejection in Si(Li) X-ray detection systemsJournal of Physics E: Scientific Instruments, 1972
- Escape peaks and internal fluorescence in X-ray spectra recorded with lithium drifted silicon detectorsJournal of Physics E: Scientific Instruments, 1972
- Über das kontinuierliche RöntgenspektrumAnnalen der Physik, 1922