The influence of plural scattering on the limit of resolution in electron microscopy
- 31 December 1975
- journal article
- other
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (2) , 167-169
- https://doi.org/10.1016/s0304-3991(75)80022-2
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Thick specimens in the CEM and STEM. Resolution and image formationUltramicroscopy, 1975
- Measurement of the top bottom effect in scanning transmission electron microscopy of thick amorphous specimensJournal of Microscopy, 1974
- Die Ortsverteilung mittelschneller Elektronen bei MehrfachstreuungThe European Physical Journal A, 1963