Thick specimens in the CEM and STEM. Resolution and image formation
- 1 July 1975
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (1) , 15-31
- https://doi.org/10.1016/s0304-3991(75)80005-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Thick specimens in the CEM and STEM. I. ContrastJournal of Applied Physics, 1974
- Measurement of the top bottom effect in scanning transmission electron microscopy of thick amorphous specimensJournal of Microscopy, 1974
- The Theory of Small-Angle Multiple Scattering of Fast Charged ParticlesReviews of Modern Physics, 1963
- Zur Einfach- und Mehrfachstreuung geladener TeilchenZeitschrift für Naturforschung A, 1960
- Zur Streuung mittelschneller Elektronen in kleinste WinkelZeitschrift für Naturforschung A, 1954
- Multiple Scattering of Fast Charged ParticlesPhysical Review B, 1949