Cross-sectional TEM observation of Nb/AlO/sub x/-Al/Nb junction structures
- 1 March 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 27 (2) , 3172-3175
- https://doi.org/10.1109/20.133885
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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