Presence of critical Au-Film thickness for room temperature interfacial reaction between Au(film) and Si(crystal substrate)
- 31 May 1980
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 34 (6) , 493-497
- https://doi.org/10.1016/0038-1098(80)90659-6
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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