Microstructure and Microwave Properties of YBa2Cu3O7-δ Thin Film on CaNdAlO4(001)

Abstract
High-quality YBa2Cu3O7-δ thin films have been grown on CaNdAlO4 (001) substrates by in situ laser ablation. The best transition temperature determined by AC susceptibility midpoint was 88.3 K with a critical current density of 1.0×106 A/cm2 at 77 K. The full width at half maximum of the X-ray rocking curve of the YBCO (004) peak was 0.33°. The film crystallinity was slightly worse than those grown on LaAlO3 and NdGaO3 judging from electron channeling pattern. A 2.3 GHz resonator made from a YBCO film on CaNdAlO4 exhibited a low power Q of 3,945 which is worse than films on LaAlO3 (Q∼18,000) and also lower than the expected value from loss tangent data.