Microscopies de champ proche optique : application aux semiconducteurs
Open Access
- 1 January 1994
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 5 (4-6) , 427-433
- https://doi.org/10.1051/mmm:0199400504-6042700
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Near-field optical microscope using a silicon-nitride probeApplied Physics Letters, 1993
- Noise modeling and measurement techniques (HEMTs)IEEE Transactions on Microwave Theory and Techniques, 1988