A study of parallel-field magnetoresistance of accumulation layers at anodic oxide films on n-(Hg, Cd)Te and the diamagnetic Shubnikov-de Haas effect
- 1 July 1988
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 3 (7) , 654-663
- https://doi.org/10.1088/0268-1242/3/7/005
Abstract
No abstract availableKeywords
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