Non-destructive structural analysis of surface blistering by TEM and EELS in a reflection configuration
- 1 March 2001
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 290-293, 131-134
- https://doi.org/10.1016/s0022-3115(00)00556-0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Observation of Surface Blistering by Grazing Incidence Electron MicroscopyJapanese Journal of Applied Physics, 2000
- A combinatorial study of materials in transition from amorphous to microcrystalline siliconSolid State Communications, 1999
- Macroscopic migration of implanted deuterium along a gas-bubble network in siliconJournal of Applied Physics, 1999