Measurement of the Stress and Strain on Specimens in an Electron Microscope
- 1 January 1971
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 10 (1)
- https://doi.org/10.1143/jjap.10.1
Abstract
A tensile device is developed which enables one to determine the stress-strain relationship of a specimen being extended during electron microscopic observation. The minimum detectable increment of load is about 0.01 g and the minimum detectable elongation is about 0.1%. Yield points of foils of Al and other metals are observable by 500 kV electron microscopy along the stress-strain curves.Keywords
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