Low Energy Electron Diffraction and X-Ray Photoelectron Spectroscopy Studies of the Formation of Submonolayer Interfaces of Sb/Si(111)
- 1 January 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (1R)
- https://doi.org/10.1143/jjap.27.147
Abstract
Surface reconstructions of a submonolayer Sb/Si(111) system were investigated by low-energy electron diffraction and X-ray photoelectron spectroscopy. It has been found that the surface superstructures of diffuse 2×2 (or three-domain 2×1), √3×√3, 5√3×5√3 and 7√3×7√3 are formed for the Sb coverages around one monolayer.Keywords
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